X-ray metrology, a nondestructive characterization technique, was used to evaluate the warpage induced in a silicon (Si) wafer on a substrate with a predefined warpage. Section topography (ST) images ...

During the wafer fabrication process, wafers warp into different kinds of shapes, such as spherical, cylindrical, or saddles. These wafers may exhibit a bistable state, that is, if we apply a certain ...

Using only a single-crystal piezoelectric thin wafer of lithium niobate (LN) instead of the usual two-part structure, a group from Nagoya University in Japan has created a deformable mirror that ...

Single crystal wafers, such as silicon, are the fundamental carriers of advanced electronic devices. However, these wafers exhibit rigidity without mechanical flexibility, limiting their applications ...

The interest in the wafer-scale growth of two-dimensional (2D) materials, including transition metal dichalcogenides (TMDCs), has been rising for transitioning from lab-scale devices to ...

Wafer-scale technology is making waves again, this time promising to enable artificial intelligence (AI) models with trillions of parameters to run faster and more efficiently than traditional ...

The ELENA project directly addressed these critical gaps by establishing Europe’s first commercial LNOI wafer supply and laying the groundwork for a TFLN photonic chip foundry. The €5 million ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a much-needed solution to a long-standing industry challenge through a novel ...