Wideband Nyquist DACs with high linearity are crucial in modern wireless communication systems. The linearity metrics of SFDR and 1M3 in these DACs are primarily limited by static element mismatch, ...

Evidence of Enhanced Low-Dose-Rate Sensitivity (ELDRS) in TID-induced leakage current increase was observed in ring-oscillators and SRAMs in 28nm CMOS technology exposed to ultra-high doses. Elevated ...