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AI training and inference are all about running data through models — typically to make some kind of decision. But the paths that the calculations take aren’t always straightforward, and as a model ...
Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
A Chinese company has achieved a game-changing breakthrough in photoresist, a key material for semiconductor lithography machines, successfully passing mass production tests, according to officials ...
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