The Ophir® SP920G GigE Silicon CCD High Resolution Camera is designed for industrial laser beam profiling applications. Accurately captures and analyzes wavelengths from 190nm - 1100nm. Features a ...

This technique expands the measurement range of the camera to include smaller beams, which could not be ordinarily measured due to the pixel size of the detector array. Near field profiling is ...

Especially useful with pulsed lasers, an optional variable attenuator for the BeamStar FX beam profiler CCD camera provides control over four orders of magnitude between the wavelengths of 350 nm and ...