Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

Researchers have combined two microscopic imaging techniques in one microscope, providing scientists with a high-resolution method of tracking single molecules in a cellular context. The development ...

In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...

Breakthroughs, discoveries, and DIY tips sent six days a week. Terms of Service and Privacy Policy. Electron microscopy has existed for nearly a century, but a record ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.