(Nanowerk News) Researchers from the NIST Center for Nanoscale Science and Technology and the NIST Material Measurement Laboratory have demonstrated that a simpler technique for calibrating lateral ...
In the field of nanotechnology, where properties and functionality of nanostructures critically depend on their dimensions, measuring size differences of the order of nanometers or even angstroms is ...
Asylum Research has announced the release of the new GetReal™ Automated Probe Calibration feature. With just one click, GetReal fully calibrates the atomic force microscope (AFM) probe sensitivity and ...
Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
(Nanowerk News) As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer capable of examining ...
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